Teseq’s new NSG 3040A is an easy-to-use multifunction generator that simulates electromagnetic interference effects for immunity testing in conformity with international, national and manufacturers’ standards including the latest IEC/EN standards. The NSG 3040Asystem is designed to fulfill conducted EMC test requirements for CE mark testing, which generally include combination wave surge, Electrical Fast Transient (EFT) pulses and Power Quality Testing (PQT). Extensive expansion capabilities enable the system to be configured for a much broader range of applications.
A 7” touch panel display with superb contrast and color makes controlling the NSG 3040Aeasy.For fast and efficient data entry, input devices include an integrated keyboard and a thumbwheel with additional keys for sensitivity adjustment. To achieve quick, reliable results in a development environment a standardized test can be initiated with just a few “clicks” using the integrated Test Assistance (TA) function.
Convenient touch input buttons make each parameter’s value highly visible and allow the user to quickly select and modify all settings. A stylus is not necessary, and ramp functions can be programmed quickly and easily. Multi-step test procedures can be created and their sequence or parameter values can be changed easily.
The NSG 3040A has an Ethernet port for external PC control. The Windows-based control software simplifies test programming and compilation of complex test sequences with various types of tests. Test reports can be generated during the test operation, allowing the operator to enter observations as the test progresses and increasing the efficiency of long-term tests.
特测NSG 3040A雷击浪涌发生器主要特点
The NSG 3040A performs tests according to the following specifications:
Combination wave pulse 1, 2/50 - 8/20 μs (Hybrid-Surge pulse)Pulse
★conforms to IEC/EN 61000-4-5
★Pulse voltage (open circuit): ±200 V to 4.8kV (in 1 V steps)
★Pulse current (short circuit): ±100 A to 2.4kA
★Impedance: 2/12 Ω
★Polarity: positive / negative / alternate
★Pulse repetition: 10 s, up to 9’999s (in 1 s steps)
★Test duration: 1 to 99’999 pulses, continuous
★Phase synchronization: asynchronous, synchronous 0 to 359o (in 1o steps)
★Coupling: IEC / external
Burst (EFT) 5/50 nsPulse conforms to IEC/EN 61000-4-4
★Pulse amplitude: ±200 V to 4.8 kV (in 1 V steps) -open circuit，±100 V to 2.4 kV (50 Ω matching system)
★Burst frequency: 100 Hz to 1000 kHz
★Polarity: positive / negative / alternate
★Repetition time: 10ms to 9'999 ms
★Burst duration: 0.01 msto 9'999 ms, single pulse
★Test duration: 1 s to 9’999s, 1 min to 1600 min, endless
★Phase synchronization: asynchronous, synchronous 0 to 359o (in 1o steps)
★Coupling: internal/ external
Dips & Interruptsconforms to IEC/EN 61000-4-11, IEC/EN 61000-4-29
★Dips & Interrupts: From EUT voltage input to 0 V, 0%
★Uvar with optional variac: depending on model (VAR 3005A)
★Uvar with step transformer: 0, 40, 70, 80% (INA 650xA)
★Peak inrush current capability: > 500 A (at 230 V)
★Switching times: 1 to 5 μs (100 Ω load)
★Event time (T-Event): 20 μs to 9999 s, 0.5to 9’999 cycles
★Repetition time:10msto 9’999 ms, 1 to 9’999 s
★Test duration:1 to 99’999 events, endless
★Phase synchronization: asynchronous, synchronous 0 to 359o (in 1o steps)
Variation test (with VAR 3005A only) conforms to IEC/EN 61000-4-11
★Uvar with optional variac: up to approx. 265 V (in 1 V steps) or up to 115% Uin (in 1% steps
★Decreasing time Td: 1 ms to 9.999 s, 0.5 to 9999 cycles, abrupt
★Time at reduced voltage Ts: 1 ms to 9.999 s, 0.5 to 9999 cycles,
★Increasing time Ti: 1 ms to 9.999 s, 0.5 to 9999 cycles,
★Repetition time: 1sto 9’999 s
★Events: 1 to 99’999
Pulsed magnetic field in conjunction with MFC 30 conforms to IEC/EN 61000-4-9
★Field: 100to 1200 A/m
★Polarity: positive / negative / alternate
★Repetition time: 10s to 9999s(in 1 s steps)
★Impedance: 2 Ω
★Coil / impedance factor: 0.01 to 100.00
★Test duration: 1 to 9’999 pulses, endless
★Phase synchronization: asynchronous, synchronous 0 to 359o (in 1o steps)
特测NSG 3040A雷击浪涌发生器Options
